Real-time jitter measurements

摘要

Traditional batch-mode methods for measuring jitter using real-time oscilloscopes, while providing very accurate and repeat-able measurement results, are limited in their time coverage. One solution to this problem is the application of high-speed ASIC technology to provide real-time clock recovery and jitter measurements. The wide time coverage of this method allows the capture and measurement of even low probability events such as the repeating of long pseudo-random bit patterns as well as external interference.