Instruments tackle IC test chores

摘要

Semiconductor independent device manufacturers, foundries, and test and assembly houses typically use dedicated turnkey ATE systems for high-volume, high-speed production test. However, there are many stages in the chip design, development, and ramp-up process when more general-purpose, flexible benchtop or modular instruments might be more appropriate to use. Joey Tun, senior product manager for precision DC at National Instruments, said, "The NI PXIe-4139 is a high-power, high-precision source measure unit (SMU) designed for functional and parametric testing of a wide range of semiconductor devices at the package or wafer level." He added, "The NI PXIe-4139 features NI SourceAdapt technology, which allows engineers to produce optimal SMU response to any load including capacitive or inductive loads by customizing the SMU control loop," thereby protecting the DUT and improving system stability.