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Pursuing efficiency from wafer to system

机译:从晶圆到系统追求效率

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摘要

Power electronic devices are proliferating, finding use in applications ranging from PV and wind farms to high-brightness, efficient lighting. To make sure these devices will perform efficiently and reliably, designers and applications engineers will need ways to accurately characterize and test them all the way from the wafer level through the circuit-board (Figure 1) and subsystem level to final product. Bill Gatheridge, product manager at Yokogawa, summarized the classes of instruments his company makes for power test. Power analyzers, he said, can perform power-input/output efficiency tests during validation and characterization stages to meet Energy Star requirements, for example. "Digital oscilloscopes are used throughout the design and development process," he added. "They also are very useful in the circuit debug operations." Further, he said, "Function generators can be used to generate basic and application-specific arbitrary waveforms for circuit testing during the design and development process. During the debug operation, the function generator can be used to create noise that is applied to the device being designed or tested."
机译:电力电子设备正在激增,并在从光伏和风电场到高亮度,高效照明的各种应用中得到使用。为了确保这些设备能够高效,可靠地运行,设计人员和应用工程师将需要各种方法来准确地表征和测试它们,从晶圆级到电路板(图1),子系统级到最终产品。横河电机产品经理Bill Gatheridge总结了他的公司用于功率测试的仪器的类别。他说,功率分析仪可以在验证和表征阶段进行功率输入/输出效率测试,以满足能源之星的要求。他补充说:“数字示波器被用于整个设计和开发过程。” “它们在电路调试操作中也非常有用。”他还说:“函数发生器可用于在设计和开发过程中生成基本的和特定于应用的任意波形,用于电路测试。在调试操作期间,函数发生器可用于产生施加到器件的噪声。正在设计或测试中。”

著录项

  • 来源
    《Evaluation Engineering》 |2015年第8期|16-18|共3页
  • 作者

    Rick Nelson;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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