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Acoustic verification of mold compounds

机译:模塑料的声学验证

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摘要

A large lot of plastic-packaged ICs is on its way to surface-mounting. The components have passed electrical inspection, where those having functional defects were removed. They have passed optical inspection to find those components having external defects, and they have undergone mass acoustic imaging to find those components having internal structural defects. The survivors of these tests will be surface-mounted and perform reliably for their expected lifespans. What could go wrong? What could go wrong is an abrupt in-service failure due to an inconspicuous change in the packaging material from that used in previous lots. What typically happens is that the maker of the components has for some reason—cost, availability, processing characteristics, or perhaps even unknowingly—received a modified or altogether different encapsulant material from its suppliers to package the die. A discreet change will not show up in the electrical inspection, optical imaging, or acoustic imaging mentioned above. The changed thermal, mechanical, and adhesive properties of the mold compound, however, can lead to unexpected damage during reflow or in service. Specifically, these components will differ from those in previous lots in two material characteristics: the acoustic impedance of the mold compound and the acoustic attenuation of the mold compound. An acoustic micro imaging tool such as those in Sonoscan's C-SAM lineup can measure each of these values quickly and easily.
机译:大量塑料封装的IC即将进行表面安装。这些组件已通过电气检查,并删除了有功能缺陷的组件。他们已经通过光学检查以找到具有外部缺陷的那些组件,并且他们已经进行了声波成像以发现具有内部结构缺陷的那些组件。这些测试的幸存者将安装在表面,并在预期寿命内可靠地运行。可能出什么问题了?可能出问题的是,由于包装材料与以前批次中使用的包装材料相比没有明显变化,因此突然出现了服务故障。通常发生的情况是,组件制造商出于某种原因(成本,可用性,加工特性,或者甚至是在不知不觉中)从供应商那里收到了经过修改或完全不同的密封剂材料,用于封装芯片。谨慎的更改不会在上述的电气检查,光学成像或声学成像中显示。但是,模塑料的热,机械和粘合性能发生了变化,在回流或使用过程中可能导致意外损坏。具体而言,这些成分与先前批次的成分在两个材料特性方面有所不同:模塑料的声阻抗和模塑料的声衰减。诸如Sonoscan的C-SAM系列中的声学显微成像工具可以快速,轻松地测量每个值。

著录项

  • 来源
    《Evaluation Engineering》 |2017年第10期|24-25|共2页
  • 作者

    Tom Adams;

  • 作者单位

    Consultant, Sonoscan Inc.;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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