Test Challenges for High-Speed Buses in Today's SOCs

摘要

Today' s deep submicron system-on-a-chip (SOC) CMOS semiconductor technology is creating a new generation of electronic products that spans a broad range of applications. The key benefit of SOC technology is its capability to integrate primary system functions on one piece of silicon. Hewlett-Packard has coined the acronym MACH-D to describe the features of a test system needed to address these devices.