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Meeting the Challenges in Manufacturing Known Good Die

机译:应对制造已知良好模具的挑战

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摘要

The use of KGD provides a cost-effective means to produce fully tested memory and multichip modules. With this process, the cost of producing KGD will be less than the cost of producing packaged parts because the cost per use of the carrier is less than typical packaging costs. Bare die can be fully tested using many of the same processes used to test packaged devices. While there are challenges, there also are viable solutions available today that enable the manufacture of KGD. KGD provides unique benefits that will be critical in many new packaging applications.
机译:使用KGD提供了一种经济有效的方法来生产经过全面测试的存储器和多芯片模块。通过这种方法,生产KGD的成本将低于生产包装部件的成本,因为每次使用载体的成本均低于典型的包装成本。裸露的裸片可以使用与测试封装器件相同的许多过程进行全面测试。尽管存在挑战,但今天也有可行的解决方案可用于制造KGD。 KGD具有独特的优势,这在许多新包装应用中至关重要。

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