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MEMS TECHNOLOGY IS TRANSFORMING HIGH-DENSITY SWITCH MATRICES

机译:MEMS技术正在转换高密度开关矩阵

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摘要

The signal and power switching systems, which are often required for high-volume automated testing, are sometimes overlooked-but they are critical ingredients that play an outsized role in determining overall measurement system performance and cost. Like all electronic devices, EMRs and reed relays, the mainstay of current ATE switching systems, have limitations that directly impact the overall cost-of-ownership and cost-of-test. That said, MEMS switch technology has been problematic for decades and has only recently surmounted its most vexing challenges, allowing them to replace EMRs in many of their core applications. In addition to switching low power and low-frequency signals, MEMS switches can now handle kilowatts of power reliably and pass frequencies well into the millimeter-wave spectrum. Finally, as MEMS switch technology is just beginning to exploit its potential, new performance benchmarks will continue to be set for many years to come.
机译:高批量自动化测试通常需要的信号和电源开关系统有时被忽略 - 但它们是在确定整体测量系统性能和成本方面发挥突出角色的关键成分。与所有电子设备,EMRS和簧片继电器一样,当前ATE交换系统的主干具有直接影响整体所有权成本和测试成本的限制。也就是说,MEMS开关技术几十年来存在问题,并且最近仍然超越了其最具烦恼的挑战,使他们能够在许多核心应用中取代EMR。除了切换低功率和低频信号外,MEMS开关现在还可以可靠地处理功率千瓦,并将频率置于毫米波频谱中。最后,随着MEMS开关技术刚刚开始利用其潜力,新的性能基准将继续设置许多年来。

著录项

  • 来源
    《Evaluation Engineering》 |2019年第7期|19-21|共3页
  • 作者

    Chris Giovanniello;

  • 作者单位

    Menlo Micro;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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