Computer-Based Tester of Parameters of Mathematical Models of Seimconductor Devices

摘要

The computer-based tester of parameters of semiconductor devices is described which can be realized with the use of an IBMC/AT personal computer. The results of measurements are used in the formation of libraries of mathematical models of semiconductor devices (bipolar and field-effect transistors, diodes, and stabilizer diodes)for circuit design programs like PSpice. The numerical values of model parameters are determined by means of the original software.