ONLY MIXED-SIGNAL INTERCONNECT SOLUTION FOR SEMICONDUCTOR DEVICE PROBERS IS AVAILABLE NOW

摘要

Keithley Instruments has introduced the test industry's only cabling solutions capable of handling I-V, C-V and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current Voltage (I V), Capacitance Voltage (C V) and pulsed I V testing connections from any modern semiconductor parameter analyzer to a Cascade Microtech or SUSS MicroTec prober. The cables are designed for compatibility with Keithley's Model 4200 SCS Semiconductor Characterization System, as well as with other test instruments used for characterization.rnThe design of these high performance triaxial cable kits makes them ideal for those whose characterization requirements demand frequent switching between measurement types.