BOUNDARY-SCAN TESTING PUSHES INTO THE DESIGN a DEVELOPMENT COMMUNITY

摘要

Time certainly flies in our fast-paced electronics industry, which makes it almost five years since I offered an overview of boundary scan (a.k.a. IEEE Std. 1149.1 and as JTAG, after the Joint Test Action Group that developed it) for Electronics World's November 2006 issue. While the basic, so-called 'dot 1' standard has not changed at all during the past five years - although there are some proposals outstanding by the current working party - there have been several exciting developments with regards to tools.