Detection of terahertz radiation with diode lasers

摘要

A standard commercial semiconductor is shown to be able to detect terahertz (THz) radiation at room temperature. A voltage variation across the active region of the device upon incident THz radiation is measured. The detected voltage signal scales linearly with the THz intensity measured with a Golay cell. A detailed analysis shows that thermal effects following the THz absorption by the carrier plasma play an important role in this detection process.