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Low-power TDC scheme using DLL-based gray counter for infrared imagers

机译:使用基于DLL的灰度计数器的红外成像仪低功耗TDC方案

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摘要

A low-power time-to-digital converter (TDC) scheme for column-level single-slope analogue-to-digital converters for infrared imager is presented. This scheme greatly improves the TDC's timing precision with a novel 3-bit fine gray counter, which makes use of multi-phase clocks from a delay-lock-loop. Aimed for 384 × 288 array size uncooled infrared imager with 17 μm pixel pitch, the TDC circuits have been developed and simulated employing 0.18 μm CMOS technology. Compared with conventional two-step TDC methods, this method saves more chip area and reduces the sampling power consumption by >50%, and also eliminates the coarse-fine inconsistency problem with a simulated ±0.1 least-significant-bit differential non-linearity performance.
机译:提出了一种用于红外成像仪的列级单斜率模数转换器的低功耗时间数字转换器(TDC)方案。该方案利用新颖的3位精细灰度计数器大大提高了TDC的定时精度,该计数器利用了来自延迟锁定环的多相时钟。 TDC电路针对像素间距为17μm的384×288阵列非制冷红外成像仪,已开发并采用0.18μmCMOS技术进行了仿真。与传统的两步TDC方法相比,此方法节省了更多的芯片面积,并减少了超过50%的采样功耗,并且还消除了具有模拟±0.1最低有效位差分非线性性能的粗精细不一致问题。

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