首页> 外文期刊>Electronics & communications in Japan >Vertical Double-Gate MOSFET Device Technology
【24h】

Vertical Double-Gate MOSFET Device Technology

机译:垂直双栅极MOSFET器件技术

获取原文
获取原文并翻译 | 示例
       

摘要

Silicon device technology is facing several difficulties. Especially, explosion of power consumption due to short-channel effects (SCEs) becomes the biggest issue in further device scaling down. Fortunately, double-gate (DG) MOSFETs have promising potential to overcome this obstacle. The DG-MOSFET is recognized to be the most scalable MOSFET for its high SCE immunity. In addition, independent DG-MOSFET (4T-DG-MOSFET) has great advantage to enable the threshold voltage control for the flexible power management. Through this work, we have realized ideal DG-MOSFETs using newly developed vertical DG-MOSFET device technology. This article examines the effectiveness of the vertical DG-MOSFETs in future high-performance and ultralow-power CMOS circuits.
机译:硅器件技术面临若干困难。特别是,由于短沟道效应(SCE)引起的功耗爆炸成为进一步缩小器件尺寸的最大问题。幸运的是,双栅极(DG)MOSFET具有克服这一障碍的潜力。 DG-MOSFET具有很高的SCE抗扰性,因此被认为是最具扩展性的MOSFET。此外,独立的DG-MOSFET(4T-DG-MOSFET)具有极大的优势,可以实现阈值电压控制,从而实现灵活的电源管理。通过这项工作,我们已经使用新开发的垂直DG-MOSFET器件技术实现了理想的DG-MOSFET。本文研究了垂直DG-MOSFET在未来的高性能和超低功耗CMOS电路中的有效性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号