COMPUTER PROGRAM FOR STORAGE AND PROCESSING OF RHEED IMAGES AND ITS APPLICATION TO MBE GROWTH PROCESSES

摘要

A computer system for on-line analysis of RHEED images is described and a program specially developed for this purpose is presented. It has been used to control MBE-growth processes of CdTe and ZnTe layers. Examples of recorded diffraction patterns are shown. Intensity oscillations of diffraction spots as well as growth and desorption rates of a ZnTe layer, calculated from the period of these oscillations, are presented.