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Novel Top-Anode OLED/a-IGZO TFTs Pixel Circuit for 8K4K AM-OLEDs

机译:用于8K4K AM-OLED的新型顶阳极OLED / a-IGZO TFT像素电路

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This paper proposes amorphous indium–gallium–zinc oxide thin-film transistors (TFTs) four-transistor-two-capacitor (4T2C) pixel circuit in combination with a top-anode organic light-emitting diode (OLED) for the use in 8K4K active-matrix organic light-emitting diode displays (AM-OLEDs). The proposed pixel circuit compensates for driving TFTs threshold voltage (${V} _{extsf {TH}}$) shifts and mobility variations,${V} _{extsf {DD}}$current–resistance (${I}$${R}$) drops, and${V} _{extsf {SS}}~{I}$${R}$-induced rises. Both the positive and negative${V} _{extsf {TH}}$of the driving TFT can be sensed by the proposed circuit. In this paper, we analyze the impact of the driving TFT compensation time for low gray levels. The current error rates are calculated when TFT mobility variations are considered. The proposed pixel circuit allows an increase in the compensation time to reduce the impact of driving TFT${V} _{extsf {TH}}$and mobility variations on the performance of 4T2C pixel circuit. Conventional two-transistor-one-capacitor, five-transistor-two-capacitor, and proposed 4T2C pixel circuits are simulated and compared in this paper. The proposed pixel 4T2C circuit reduces the current error rates to below 5.79% when the${V} _{extsf {TH}}$shifts of ±2 V, mobility variations of ±10%,${V} _{extsf {DD}}~{I}$${R}$drops of 1 V, and${V} _{extsf {SS}}~{I}$${R}$rises of 1 V are all considered. We show that the proposed 4T2C pixel circuit is suitable for 8K4K AM-OLEDs.
机译:本文提出了将非晶铟-镓-氧化锌薄膜晶体管(TFT)四晶体管二电容器(4T2C)像素电路与顶部阳极有机发光二极管(OLED)结合使用的8K4K有源器件-矩阵有机发光二极管显示器(AM-OLED)。提出的像素电路补偿驱动TFT的阈值电压( n $ {V} _ { t​​extsf {TH}} $ n)变动和机动性差异, n <内联公式xmlns:mml = “ http://www.w3.org/1998/Math/MathML ” xmlns:xlink = “ http://www.w3 .org / 1999 / xlink “> $ {V} _ { t​​extsf {DD}} $ ncurrent–抵抗( n $ {I} $ n– n $ { R} $ n)删除,并且 n $ {V} _ { t​​extsf {SS}}〜{I} $ n– n $ {R} $ n引起的上升。正负n n $ {V} _ { t​​extsf {TH}} $ n驱动TFT可以被提议的电路检测到。在本文中,我们分析了驱动TFT补偿时间对低灰度级的影响。当考虑TFT迁移率变化时,将计算当前错误率。提出的像素电路允许增加补偿时间,以减少驱动TFT n $ {V} _ { t​​extsf {TH}} $ n迁移率对4T2C像素电路性能的影响。本文模拟并比较了传统的二晶体管一电容器,五晶体管二电容器和提出的4T2C像素电路。当 n $ {V} _ { t​​extsf {TH}} $ n偏移为±2 V,迁移率变化为±10 %, n $ {V} _ { t​​extsf {DD}}〜 {I} $ n– n $ {R} $ ndrops为1 V,并且 n $ {V} _ { t​​extsf {SS}}〜{I} $ n– n <内联公式xmlns:mml = “ http://www.w3.org/1998/Math/MathML ” xmlns:xlink = “ ht tp://www.w3.org/1999/xlink “> $ {R} $ n上升1 V被全部考虑。我们表明,提出的4T2C像素电路适用于8K4K AM-OLED。

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