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首页> 外文期刊>IEEE Electron Device Letters >Long-wavelength Ge/sub x/Si/sub 1-x//Si heterojunction infrared detectors and 400*400-element imager arrays
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Long-wavelength Ge/sub x/Si/sub 1-x//Si heterojunction infrared detectors and 400*400-element imager arrays

机译:长波长Ge / sub x / Si / sub 1-x // Si异质结红外探测器和400 * 400元素成像仪阵列

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摘要

Heterojunction Ge/sub x/Si/sub 1-x//Si internal photoemission infrared detectors exhibiting nearly ideal thermionic-emission dark-current characteristics have been fabricated with cutoff wavelengths out to 16 mu m. High-quality imaging without uniformity correction has been demonstrated in the long-wavelength infrared (LWIR) spectral band for 400*400-element focal plane arrays consisting of Ge/sub 0.44/Si/sub 0.56/ detectors with a cutoff wavelength of 9.3 mu m and monolithic charged-coupled-device readout circuitry. The Ge/sub 0.44/Si/sub 0.56/ composition was chosen in order to obtain a barrier height low enough to yield a cutoff length within the LWIR band, but high enough to permit low dark-current operation at about 50 K.
机译:已经制造了具有接近理想的热电子发射暗电流特性的异质结Ge / sub x / Si / sub 1-x // Si内部光发射红外探测器,其截止波长高达16μm。在长波长红外(LWIR)光谱带中已证明了用于400 * 400元素焦平面阵列的高质量成像,该阵列由Ge / sub 0.44 / Si / sub 0.56 /探测器组成,其截止波长为9.3μm m和单片电荷耦合器件读出电路。选择Ge / sub 0.44 / Si / sub 0.56 /组成是为了获得足够低的势垒高度,以在LWIR波段内产生截止长度,但又足够高,以允许在约50 K的低暗电流下工作。

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