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Monolithic 3D Integration of InGaAs Photodetectors on Si MOSFETs Using Sequential Fabrication Process

机译:使用顺序制造工艺的INGAAS光电探测器INGAAS光电探测器的单片3D集成

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摘要

We demonstrated the monolithic 3D (M3D) integration of InGaAs photodetectors (PDs) on silicon-on-insulator metal-oxide-semiconductor field-effect transistors (SOI-MOSFETs) by the sequential process of InGaAs PDs on pre-fabricated SOI-MOSFETs. InGaAs PDs and SOI MOSFETs showed their original performances after integration and sequential process thanks to the low-temperature process. In addition, the integrated devices successfully performed the fundamental readout circuit operation such as direct injection and source follower per detector (SFD) by connecting transistors (Trs) and PDs. By illuminating 1550 nm laser on InGaAs PDs, the different behaviors of output voltages were clearly obtained according to the Tr's on/off state. From these results, we believe that this monolithic 3D integration method could be a feasible approach toward high-resolution multicolor imaging systems.
机译:我们通过在预制造的SOI-MOSFET上的顺序过程证明了InGaAs光电探测器(PDS)在绝缘体上的单片3D(M3D)集成在绝缘体上的硅 - 在绝缘体金属氧化物 - 半导体场效应晶体管(SOI-MOSFET)上集成。由于低温工艺,Ingaas PD和SOI MOSFET在集成和顺序过程之后显示了它们的原始性能。此外,集成器件通过连接晶体管(TRS)和PDS成功地执行了基本读出电路操作,例如每次检测器(SFD)的直接喷射和源跟随器。通过在InGaAs PD上照射1550nm激光,根据TR的开/关状态清楚地获得输出电压的不同行为。从这些结果来看,我们认为,这种单片3D集成方法可以是高分辨率多色成像系统的可行方法。

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