A Novel Approach for Modeling Near-Field Coupling With PCB Traces

摘要

This paper presents a novel modeling approach for predicting the response of a printed circuit board (PCB) trace excited by a nonuniform electromagnetic (EM) radiated field from complex electronic components. The proposed approach is analytic and it is based on transmission line model with distributed sources taking into account the effect of the effective relative permittivity ${varepsilon}_{rm reff}$ of the PCB surrounding medium. The modeling procedure is a two-step approach: three-dimensional radiated emission modeling of the electronic component, source of EM disturbance, and using a set of equivalent sources followed by the computation of the induced voltages in the trace terminals referring to analytic coupling formulations. Comparison between modeled, numerical, and measured results enables us to validate the proposed model.