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首页> 外文期刊>IEEE Transactions on Electromagnetic Compatibility >EMI Shielding Effectiveness of Polyacrylonitrile Fabric With Polyaniline Deposition by Reactive Ink-Jet Printing and Model Approach
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EMI Shielding Effectiveness of Polyacrylonitrile Fabric With Polyaniline Deposition by Reactive Ink-Jet Printing and Model Approach

机译:反应性喷墨印刷聚苯胺沉积聚丙烯腈织物的EMI屏蔽效果及模型方法

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摘要

This study reports the simple, inexpensive, and in situ deposition of polyaniline (PANI) on polyacrylonitrile (PAN) woven fabric with the reactive ink-jet printing technique aimed at the manufacturing of multilayered electromagnetic interference (EMI) shields. The electrical characteristics of fabric samples are measured by the van der Pauw method. The surface resistance value of the treated fabrics steadily decreases when the number of the PANI-printed layers increases and reaches the lowest surface resistance value of 20 Ω/sq. The PANI-printed PAN structures are characterized and evaluated in terms of their electromagnetic shielding effectiveness (SE), absorption (insertion loss), and reflection characteristics. These characteristics are determined by means of a network analyzer with a frequency range from 2.6 to 18 GHz. One layer of PAN fabric ink-jet printed with conducting PANI, which gives a surface weight equal to ca 20 g/m2, shows a SE of ca 5 dB. However, tripling the surface weight of PANI on PAN fabric shows a SE of ca. 12 dB, whereas a fivefold increase in the PANI surface weight shows a SE of ca. 22 dB. The equivalent analog circuit model with an approximation approach for predicting the SE, reflection coefficient, and insertion loss for the cases, which are not experimentally tested is proposed.
机译:这项研究报告了反应性喷墨印刷技术旨在制造多层电磁干扰(EMI)屏蔽层,在聚丙烯腈(PAN)机织织物上简单,廉价且原位沉积聚苯胺(PANI)。织物样品的电特性通过van der Pauw方法进行测量。当PANI印刷层的数量增加并达到最低表面电阻值20Ω/ sq时,处理过的织物的表面电阻值会稳步下降。通过PANI印刷的PAN结构的电磁屏蔽效率(SE),吸收(插入损耗)和反射特性来表征和评估。这些特性是通过网络分析仪确定的,频率范围为2.6至18 GHz。一层用导电PANI喷墨印刷的PAN织物,其表面重量等于约20 g / m2,显示SE约为5 dB。但是,将PAN织​​物上PANI的表面重量增加三倍,则SE约为。 12 dB,而PANI表面重量增加五倍则表明SE约为22分贝提出了一种具有近似方法的等效模拟电路模型,用于预测未经过实验测试的情况下的SE,反射系数和插入损耗。

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