A little electrical overstress won't hurt, right?

摘要

Thermal overstress with a transformer or metallization damage at the bond-wire junction of an IC can cause IC EOS (electrical overstress), which in turn can create an electrical short. An EOS event also can compromise the integrity of the IC's ESD (electrostatic-discharge) circuitry. In this case, the voltage exposure to an IC's input or output pin is well below the voltage and well above the exposure time of an ESD event.