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iIn situ/i TEM study of deformation-induced crystalline-to-amorphous transition in silicon

机译:硅中形变诱导的晶体向非晶转变的原位TEM研究

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Sharper insights into stress-induced, crystalline-to-amorphous transitions in silicon can be realized with crack-resistant micropillars. Mechanical processes such as polishing during the manufacture of photovoltaic cell alter silicon's crystal structure and degrade device performance. Wei Zhang and Zhi-Wei Shan from Xi'an Jiaotong University in China and co-workers have now used high-resolution transmission electron microscopy to capture in situ images of these transitions in progress. The team designed a system of submicrometre pillars consisting of a crystalline silicon core encased in a nanoscale shell of amorphous silicon. The flexible shell helped prevent brittle fracture from occurring while the pillars were gradually compressed into mushroom shapes by an indentation tool. Real-time imaging revealed that mechanical force deformed the silicon framework through plastic motions only – a finding that upsets previous concepts of intermediate crystalline phases taking part in the amorphization process.
机译:通过抗裂微柱,可以更清晰地了解硅中应力引起的晶体到非晶态的转变。在光伏电池制造过程中进行抛光等机械过程会改变硅的晶体结构,并降低器件性能。中国西安交通大学的张伟和单志伟及其同事现在已经使用高分辨率透射电子显微镜来捕获这些进行中的转变的原位图像。该团队设计了一个亚微米柱状系统,该系统由包裹在非晶硅纳米级外壳中的晶体硅芯组成。柔性外壳有助于防止在通过压痕工具将柱子逐渐压缩成蘑菇形时发生脆性断裂。实时成像显示,机械力仅通过塑性运动使硅框架变形,这一发现使以前参与非晶化过程的中间晶体相的概念不安。

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