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Understanding the Growth Mechanism of GaN Epitaxial Layers on Mechanically Exfoliated Graphite

机译:了解机械剥离石墨上GaN外延层的生长机理

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摘要

The growth mechanism of GaN epitaxial layers on mechanically exfoliated graphite is explained in detail based on classic nucleation theory. The number of defects on the graphite surface can be increased via O-plasma treatment, leading to increased nucleation density on the graphite surface. The addition of elemental Al can effectively improve the nucleation rate, which can promote the formation of dense nucleation layers and the lateral growth of GaN epitaxial layers. The surface morphologies of the nucleation layers, annealed layers and epitaxial layers were characterized by field-emission scanning electron microscopy, where the evolution of the surface morphology coincided with a 3D-to-2D growth mechanism. High-resolution transmission electron microscopy was used to characterize the microstructure of GaN. Fast Fourier transform diffraction patterns showed that cubic phase (zinc-blend structure) GaN grains were obtained using conventional GaN nucleation layers, while the hexagonal phase (wurtzite structure) GaN films were formed using AlGaN nucleation layers. Our work opens new avenues for using highly oriented pyrolytic graphite as a substrate to fabricate transferable optoelectronic devices.
机译:基于经典的成核理论,详细解释了机械剥落石墨上的GaN外延层的生长机理。石墨表面上的缺陷数量可以通过O-等离子体处理来增加,从而导致石墨表面上的成核密度增加。 Al元素的添加可以有效地提高成核速率,从而可以促进致密成核层的形成和GaN外延层的横向生长。通过场发射扫描电子显微镜表征成核层,退火层和外延层的表面形态,其中表面形态的演变与3D至2D生长机制相吻合。高分辨率透射电子显微镜用于表征GaN的微观结构。快速傅里叶变换衍射图表明,使用常规GaN成核层可获得立方相(锌共混结构)GaN晶粒,而使用AlGaN成核层形成六方相(纤锌矿结构)GaN膜。我们的工作为使用高度取向的热解石墨作为基材制造可转移的光电器件开辟了新途径。

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