【24h】

Failure Mechanisms in Wet Tantalum Capacitors

机译:湿钽电容器的失效机理

获取原文
获取外文期刊封面目录资料

摘要

The wet tantalum capacitor is well established in both power supply smoothing and timing applications and has a well proven high reliability. This paper reviews the mechanisms of the possible failures arising from mis-application or over-stressing. The effect of over voltage on the anodic oxide is considered and the influence of cathode structure on reverse voltage and ripple current capability is discussed. The silver cathode allows migration of silver ions through the electrolyte under appropriate conditions and hence produces a failure mechanism not present in the tantalum cathode device. The life of a wet tantalum unit is eventually limited by loss of water vapour leading toopen-circuit. Results are presented for button style capacitors which suggest that this is in fact not a practicallimitation.
机译:湿钽电容已在电源平滑和定时应用中建立了良好的地位,并具有公认的高可靠性。本文回顾了因应用不当或过大压力而可能导致故障的机制。考虑了过电压对阳极氧化物的影响,并讨论了阴极结构对反向电压和纹波电流能力的影响。银阴极允许银离子在适当的条件下通过电解质迁移,因此产生了钽阴极器件中不存在的失效机理。湿钽单元的寿命最终受到导致开路的水蒸气损失的限制。给出了纽扣式电容器的结果,表明这实际上不是实际的限制。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号