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Analysis of Wide-Bandgap Material OPFET UV Detectors for High Dynamic Range Imaging and Communication Applications

机译:用于高动态范围成像和通信应用的宽带隙材料OPFET UV检测器的分析

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The ultraviolet (UV) photoresponses of Wurtzite GaN, ZnO, and 6H-SiC-based Optical Field Effect Transistor (OPFET) detectors are estimated with an in-depth analysis of the same considering the generalized model and the front-illuminated model for high resolution imaging and UV communication applications. The gate materials considered for the proposed study are gold (Au) and Indium-Tin-Oxide (ITO) for GaN, Au for SiC, and Au and silver dioxide (AgO_(2)) for ZnO. The results indicate significant improvement in the Linear Dynamic Range ( LDR ) over the previously investigated GaN OPFET (buried-gate, front-illuminated and generalized) models with Au gate. The generalized model has superior dynamic range than the front-illuminated model. In terms of responsivity, all the models including buried-gate OPFET exhibit high and comparable photoresponses. Buried-gate devices on the whole, exhibit faster response than the surface gate models except in the AgO_(2)-ZnO generalized OPFET model wherein the switching time is the lowest. The generalized model enables faster switching than the front-illuminated model. The switching times in all the cases are of the order of nanoseconds to picoseconds. The SiC generalized OPFET model shows the highest 3-dB bandwidths of 11.88 GHz, 36.2 GHz, and 364 GHz, and modest unity-gain cut-off frequencies of 4.62 GHz, 8.71 GHz, and 5.71 GHz at the optical power densities of 0.575 μW/cm~(2), 0.575 mW/cm~(2), and 0.575 W/cm~(2) respectively. These are in overall, the highest detection-cum-amplifi-cation bandwidths among all the investigated devices. The same device exhibits the highest LDR of 73.3 dB. The device performance is superior to most of the other existing detectors along with comparable LDR , thus, emerging as a high performance photodetector for imaging and communication applications. All the detectors show considerably high detectivities owing to the high responsivity values. The results have been analyzed by the photovoltaic and the photoconductive effects, and the series resistance effects and will aid in conducting further research. The results are in line with the experiments and the commercially available software simulations. The devices will greatly contribute towards single photon counting, high resolution imaging, and UV communication applications.
机译:考虑到高分辨率的广义模型和前照式模型,通过对Wurtzite GaN,ZnO和6H-SiC的光场效应晶体管(OPFET)检测器的紫外(UV)光响应进行了深入分析,从而对其进行了估算。成像和紫外线通讯应用。该拟议研究的栅极材料是:GaN的金(Au)和铟锡氧化物(ITO),SiC的金为Au,ZnO的金和二氧化银(AgO_(2))。结果表明,与先前研究的具有Au栅极的GaN OPFET(埋入栅极,前照明和广义)模型相比,线性动态范围(LDR)有了显着改善。广义模型比前照式模型具有更好的动态范围。就响应度而言,包括掩埋栅OPFET在内的所有模型均显示出高且可比的光响应。总体而言,埋入式栅器件比表面栅模型具有更快的响应速度,但在AgO_(2)-ZnO广义OPFET模型中,其开关时间最短。与前照式模型相比,通用模型可实现更快的切换。在所有情况下,切换时间都在纳秒到皮秒的数量级。 SiC广义OPFET模型在光功率密度为0.575μW的情况下显示出11.88 GHz,36.2 GHz和364 GHz的最高3-dB带宽,以及4.62 GHz,8.71 GHz和5.71 GHz的适度单位增益截止频率。 /cm~(2)、0.575 mW / cm〜(2)和0.575 W / cm〜(2)。在所有被调查的设备中,这些总体上是最高的检测和放大带宽。同一器件的最高LDR为73.3 dB。该设备的性能优于其他大多数现有检测器以及可比的LDR,因此成为了用于成像和通信应用的高性能光电检测器。由于具有较高的响应度值,所有检测器均显示出相当高的检测率。通过光伏效应和光电导效应以及串联电阻效应对结果进行了分析,将有助于进行进一步的研究。结果与实验和可商购的软件仿真一致。这些设备将极大地促进单光子计数,高分辨率成像和UV通信应用。

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