Time-Division-Multiplexed Test Delivery for NoC Systems

摘要

This test-scheduling approach for NoC designs minimizes test time through high-speed test delivery over the network, with test data interleaved via time-division multiplexing (TDM), and through slower test execution at the target cores. Results with a test-scheduling algorithm and a simulated test case from ITC 2002 SoC benchmarks show significant test time and I/O savings compared to a single-clock approach.