Defect Oriented Testing for Analog/Mixed-Signal Designs

Kruseman B.; Tasic B.; Hora C.; Dohmen J.; Hashempour H.; van Beurden M.; Xing Y.

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Defect Oriented Testing for Analog/Mixed-Signal Designs

机译：模拟/混合信号设计的面向缺陷的测试

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来源
《Design & Test of Computers, IEEE》 |2012年第5期|p.72-80|共9页
作者
Kruseman B.; Tasic B.; Hora C.; Dohmen J.; Hashempour H.; van Beurden M.; Xing Y.;
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作者单位

High-Tech Campus 46, NXP Semiconductors, The Netherlands;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
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关键词
Analytical models; Bridge circuits; Circuit faults; Computational modeling; Integrated circuit modeling; US Department of Transportation;

机译：分析模型;桥接电路;电路故障;计算建模;集成电路建模;美国运输部;

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1. Test infrastructure design for mixed-signal SOCs with wrapped analog cores [J] . Sehgal A., Ozev S., Chakrabarty K. IEEE transactions on very large scale integration (VLSI) systems . 2006,第3期

机译：具有封装模拟内核的混合信号SOC的测试基础架构设计
2. Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current [J] . SWARUP BHUNIA, ARIJIT RAYCHOWDHURY, KAUSHIK ROY Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2005,第2期

机译：利用动态电源电流的小波分析对模拟电路进行面向缺陷的测试
3. Using Mixed-Signal Defect Simulation to Close the Loop Between Design and Test [J] . Stephen Sunter, Krzysztof Jurga, Andrew Laidler Circuits and Systems I: Regular Papers, IEEE Transactions on . 2016,第12期

机译：使用混合信号缺陷仿真来闭合设计与测试之间的循环
4. Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing [C] . Jhon Gomez, Nektar Xama, Anthony Coyette, IEEE VLSI Test Symposium . 2020

机译：面向缺陷的模拟/混合信号测试的针孔潜在缺陷建模和仿真
5. Efficient testability design methodologies for analog/mixed-signal integrated circuits. [D] . Wang, Cheng-Ping. 1997

机译：用于模拟/混合信号集成电路的高效可测试性设计方法。
6. Analogical and Digital Workflow in the Design and Preparation of the Emergence Profile of Biologically Oriented Preparation Technique (BOPT) Crowns over Implants in the Working Model [O] . Guillermo Cabanes-Gumbau, David Soto-Peñaloza, Miguel Peñarrocha-Diago, 2019

机译：设计和准备工作模型中植入物上的生物定向制备技术（BOPT）牙冠的轮廓的模拟和数字工作流程
7. Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier [O] . Beurze, R.H., Xing, Y, Xing, Y., 1999

机译：混合信号D类放大器的面向缺陷的测试的实际实现

Defect Oriented Testing for Analog/Mixed-Signal Designs

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