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Complex manufacturing drives the need for internal inspection

机译:复杂的制造推动了内部检查的需要

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摘要

Many components and assemblies have internal features that are difficult to inspect non-destructively, as conventional metrology requires them to be sectioned. Belgian researchers are hoping to overcome these difficulties by using X-ray Computed Tomography (CT) to measure the interiors of such components in 3D.
机译:许多组件和组件的内部特征很难进行非破坏性检查,因为传统的计量学要求对它们进行分段。比利时研究人员希望通过使用X射线计算机断层扫描(CT)来测量3D中此类组件的内部来克服这些困难。

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