A few years ago, an unusual problem was encountered during an experimental disk-drive build: Drives built with one vendors heads (vendor A) suffered an excessive number of thermal asperity (TA) events. These events occur when an asperity on the disk makes contact with the read element at the trailing edge of the slider. The resulting thermal transient gives rise to an additive voltage signal—known as the TA—that can complicate the detection process.
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