Adaptive analysis of yield line patterns in plates with the arbitrary Lagrangian-Eulerian method

摘要

Plasticity models provide suitable tools to describe the so-called yield line pattern that occurs with the failure of plates. However, in a Lagrangian description a huge number of finite elements are needed for accurate solutions. Accuracy can be combined with low computer costs by means of the arbitrary Lagrangian-Eulerian (ALE) method. With the ALE method, the finite element mesh is automatically refined in the yield lines. A new remesh indicator is proposed that captures newly appearing yield lines as well as already formed yield lines. Numerical examples shown the effectiveness of this approach.