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Experimental application and enhancement of the XFEM-GA algorithm for the detection of flaws in structures

机译:XFEM-GA算法在结构缺陷检测中的实验应用和增强

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摘要

The extended finite element formulation (XFEM) combined with genetic algorithms (GAs) have previously been shown to be very effective in the detection of flaws in structures. By this approach, the XFEM is used to model the forward problem and a GA is used as the optimization scheme, converging to the true flaw. The convergence is obtained by minimizing the error between sensor measurements and data obtained by solving the forward problem. The current study proposes several advances of this XFEM-GA algorithm, more specifically: (i) a novel genetic algorithm that accelerates the convergence of the scheme and alleviates entrapment in local optima, (ii) a generic XFEM formulation of an elliptical hole which is utilized to detect any type of flaw (cracks or holes) of any shape, and (iii) experimental verification of the approach for an arbitrary crack in a 2D plate. Convergence studies on various benchmark problems including the experimental verification clearly show the potential of this approach to detection of arbitrary flaws.
机译:扩展的有限元公式(XFEM)与遗传算法(GA)相结合,先前已被证明在检测结构缺陷方面非常有效。通过这种方法,使用XFEM对正向问题进行建模,并使用GA作为优化方案,从而收敛到真正的缺陷。通过最小化传感器测量值与通过解决前向问题获得的数据之间的误差来获得收敛。当前的研究提出了该XFEM-GA算法的一些进展,更具体地说:(i)一种新颖的遗传算法,该算法可加快方案的收敛速度,并减轻局部最优值的陷入,(ii)椭圆孔的通用XFEM公式为用于检测任何形状的任何类型的缺陷(裂纹或孔洞),以及(iii)实验验证2D板中任意裂纹的方法。对各种基准问题(包括实验验证)的收敛性研究清楚地表明了这种方法检测任意缺陷的潜力。

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