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Mapping Trigger Conditions onto Trigger Units during Post-silicon Validation and Debugging

机译:硅后验证和调试期间将触发条件映射到触发单元

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On-chip trigger units are employed for detecting events of interest during post-silicon validation and debugging. Their implementation constrains the trigger conditions that can be programmed at runtime. It is often the case that some trigger events of interest, which were not accounted for during design time, cannot be detected due to the constraints imposed by the hardware implementation of the trigger units. To address this issue, we present architectural features that can be included into the trigger units and discuss the algorithmic approach for automatically mapping trigger conditions onto the trigger units.
机译:片上触发单元用于在硅后验证和调试期间检测感兴趣的事件。它们的实现限制了可以在运行时编程的触发条件。通常情况下,由于触发单元的硬件实现施加了限制,因此无法检测到某些感兴趣的触发事件,而这些触发事件在设计时并未考虑到。为了解决这个问题,我们介绍了可以包含在触发单元中的体系结构功能,并讨论了将触发条件自动映射到触发单元上的算法方法。

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