Improved definition of the effective number of bits in ADC testing

摘要

This paper deals with the study of the well-known parameter Effective Number Of Bits (ENOB) in ADC testing. Some limits of the ENOB classical definition, related to the variable slope of the sine wave, are shown. Furthermore, the new parameter Linearized ENOB (LENOB), able to overcome these limits, is defined. Finally, numerical simulations and applications are presented to show the effectiveness of this parameter.