A state of the art on ADC modelling

摘要

The state of the art of the research on modelling of analog-to-digital converter (ADC)-based measuring devices is surveyed. Main topics of modelling are reviewed according to the fields of prevailing scientific interest in metrological research such as quantization models, error models, and correction-aimed models. In these fields, recent developments are analysed with the aim of focusing both the contemporary situation and the imminent trends.