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Modified model for instability analysis of symmetric FGM double-sided nano-bridge: Corrections due to surface layer, finite conductivity and size effect

机译:对称FGM双面纳米桥不稳定性分析的改进模型:由于表面层,有限电导率和尺寸效应而引起的校正

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Finite conductivity, size dependency and surface layer are known as crucial factors that affect the electromechanical response and pull-in instability of microano-electromechanical systems (MEMS/NEMS). However, these effects are yet ignored on modeling the instability of MEMS/NEMS fabricated from functionally graded materials (FGMs). Herein, a modified continuum model is developed to incorporate these effects on the dynamic behavior and electromechanical instability of double-sided FGM NEMS bridge. Using Gurtin Murdoch model in conjunction with nonlocal Eringen elasticity, the governing equations of the nano-bridges is derived considering the surface layer and size dependency. The Coulomb and Casimir forces are incorporated in the governing equation considering the corrections due to the finite conductivity of FGM (relative permittivity and plasma frequency). The validity of the proposed method is elucidated by comparing the results obtained from the present study with the results reported in the literature. The stability analysis of the nanostructure is conducted by plotting time history and phase portraits. The effects of various parameters including finite conductivity, nonlocal parameter, surface stresses and material characteristics on the dynamic pull-in behavior of the nano-bridges are studied. The obtained results imply a significant impact of the abovementioned corrections on the instability threshold and pull-in parameters of the FGM nanobridge. (C) 2015 Elsevier Ltd. All rights reserved.
机译:有限的电导率,尺寸依赖性和表面层是影响微/纳米机电系统(MEMS / NEMS)的机电响应和拉入不稳定性的关键因素。但是,在对由功能梯度材料(FGM)制成的MEMS / NEMS的不稳定性进行建模时,这些影响尚未被忽略。本文中,开发了一种改进的连续体模型,以将这些影响纳入双面FGM NEMS桥的动态行为和机电不稳定性。将Gurtin Murdoch模型与非局部Eringen弹性相结合,考虑了表面层和尺寸依赖性,得出了纳米桥的控制方程。考虑到由于FGM的有限电导率(相对介电常数和等离子体频率)而进行的校正,将库仑力和卡西米尔力合并到控制方程中。通过比较从本研究获得的结果与文献报道的结果,阐明了所提出方法的有效性。纳米结构的稳定性分析是通过绘制时间历史和相图进行的。研究了有限电导率,非局部参数,表面应力和材料特性等各种参数对纳米桥动态拉入行为的影响。获得的结果暗示了上述校正对FGM纳米桥的不稳定性阈值和引入参数的重大影响。 (C)2015 Elsevier Ltd.保留所有权利。

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