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Effects of Resin Binder on Characteristics of Sintered Aluminum–Copper Nanopaste as High-Temperature Die-Attach Material

机译:树脂粘结剂对高温固模烧结铝铜纳米糊料性能的影响

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This paper aims to report an aluminum-copper (Al-Cu) die-attach system as a Pb-free alternative for electronic applications. The Al-Cu die-attach system is formulated by a mixture of Al and Cu nanoparticles and a constituent of organic compounds and sintered at 380 degrees C +/- 10 degrees C without any pressure application. The effects of organic additives on physical, structural, and electrical properties are investigated to understand the die-attach quality of Al-Cu nanopaste. The formation of CuAl2 phase is discovered, which confirmed the joining of Al and Cu nanoparticles in sintered nanopaste layer. Solid-state fusion of Al and Cu can be seen in scanning electron microscope (SEM) analysis. Energy dispersive X-ray (EDX) analysis demonstrates sample of 0.25-g V006A has the lowest oxygen element at 15.36%. Sample with 0.25-g organic additives exhibits the smallest crystallite size and electrical resistivity, which were 8.15 nm and 21 mu Omega.cm, which is favorable for high-temperature applications.
机译:本文旨在报告一种铝铜(Al-Cu)芯片连接系统,作为电子应用中的无铅替代品。 Al-Cu芯片附着系统由Al和Cu纳米粒子的混合物以及有机化合物的成分配制而成,并在380摄氏度+/- 10摄氏度的条件下烧结而无需施加任何压力。研究了有机添加剂对物理,结构和电性能的影响,以了解Al-Cu纳米浆料的芯片附着质量。发现了CuAl2相的形成,这证实了Al和Cu纳米颗粒在烧结的纳米浆料层中的结合。在扫描电子显微镜(SEM)分析中可以看到Al和Cu的固态融合。能量色散X射线(EDX)分析表明0.25克V006A样品中的氧元素最低,为15.36%。含0.25 g有机添加剂的样品呈现出最小的微晶尺寸和电阻率,分别为8.15 nm和21μOΩ.cm,非常适合高温应用。

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