Analysis of process yield in a cost-effective double acceptance sampling plan

摘要

In this manuscript, we have developed an enhanced second stage structure of variable double acceptance sampling (DAS) plan to increase its efficiency and decrease the expected cost of inspection. Measured quality characteristics based on the two independent random samples are not intermixed in our proposed second stage. We have analyzed process yield index for linear profiles for two-sided specifications as a gauge for a scientific decision. Desirable quality levels and tolerable risks are used to optimize the plan parameters. The proposed DAS plan requires smaller expected sample sizes to be inspected and its performance is evaluated through operating characteristic function. A practical example is provided to demonstrate the proposed plan.