The Design of Truncated Sequential Test Plans Based on Attributes Data

摘要

This study investigates the effect of the choice of a truncation strategy on sequential test plan performance for test plans based on attributes data. We present numerical results that demonstrate the effect of varying the truncation sample size m and reject value R for plans having essentially equivalent Type Ⅰ and Type Ⅱ error probabilities. The results show that the choice of m and R should not be taken lightly, as both parameters have a significant effect on test performance.