On Confidence Intervals for Process Capability Indices in a One-Way Random Model

摘要

In this article, we investigated the bootstrap calibrated generalized confidence limits for process capability indices Cpk for the one-way random effect model. Also, we derived Bissell's approximation formula for the lower confidence limit using Satterthwaite's method and calculated its coverage probabilities and expected values. Then we compared it with standard bootstrap (SB) method and generalized confidence interval method. The simulation results indicate that the confidence limit obtained offers satisfactory coverage probabilities. The proposed method is illustrated with the help of simulation studies and data sets.