Self-tested self-synchronization circuit for mesochronous clocking

摘要

In large-scale and high-speed systems, global synchronization hasnbeen commonly used to protect clocked I/O from data read failure causednby metastability. There are many drawbacks with global synchronization,nwhich will approach its physical limit in the future as system clocknfrequency and system scale increase simultaneously. Mesochronousnclocking overcomes these drawbacks, but without a proper delay or phasencontrol, a metastability problem occurs. Self-testednself-synchronization (STSS) was proposed to solve this problem. In thisnpaper, we describe two STSS methods, STSS-1 and STSS-2, implemented byntwo-phase input ports for parallel/serial data transfer. Measurements onna test chip for the two methods show that a data rate of 750 Mb/s isnreached with 3.6-V power supply in 0.6-Μm CMOS. Comparison is madenbetween STSS-1 and STSS-3