Separating sequence overlap for automated test sequence generation

摘要

Finite state machines have been used to model a number of classes of system and there has thus been much interest in the automatic generation of test sequences from finite state machines. Many finite state machine based test techniques utilize sequences that check the final states of transitions, the most general such sequence being a separating sequence: an input sequence that distinguishes between two states of an FSM. When using such techniques the test sequence length can be reduced by utilizing overlap. This paper investigates overlap for separating sequences and shows how this can be incorporated into test sequence generation.