Automated component inspection reduces test cycle

摘要

Denis Jolivet explains how a visual inspection unit using LabVIEW with IMAQ hardware and Advanced Analysis toolkit has helped to eliminate human error while retaining test timesrnof less than 300ms.rnEnsuring the quality of semiconductors is a vital step in the IC manufacturing process, and is often done by using human inspectors to visually inspect thousands of components, looking for variation or deviations. Faulty components can be identified by any number of defects such as cracks, spots, discolorations and deformations.