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Insights and optimization of the structural and mechanical properties of TiWSiN coatings using the Taguchi method

机译:用TAGUCHI方法见解及优化Tiwsin涂层的结构和力学性能

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A Taguchi L16(45) orthogonal array design was selected to determine the influence of the deposition parameters on the mechanical properties, wear volume, and corrosion resistance of TiWSiN thin films. The power applied to the silicon-tungsten target, nitrogen to argon flow ratio (N2:Ar), substrate temperature, and bias voltage were set to four levels for depositing the films using co-sputtering equipment. The hardness, wear volume, and corrosion resistance were evaluated via nanoindentation, reciprocating-sliding, and potentiodynamic polarization, respectively. The microstructure, chemical composition, and morphology were also studied, by means of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM). The obtained results were transformed into signal-to-noise ratios (S/N), and an analysis of variance (ANOVA) was performed. It was found that the power applied to the silicon target was the factor that makes the greatest difference in the evaluated films' properties. According to the combination of factors, nanocomposite structure and FCC and BCC crystalline structures were detected. Almost all of the films exhibited columnar growth; however, the columns' width was affected as the deposition conditions were modified.
机译:选择Taguchi L16(45)正交阵列设计以确定沉积参数对Tiwsin薄膜的机械性能,磨损体积和耐腐蚀性的影响。将施加到硅钨靶的功率,氮气流量比(N2:Ar),衬底温度和偏置电压设定为使用共溅射设备沉积薄膜的四个水平。通过纳米凸缘,往复滑动和电位动力学极化分别评估硬度,磨损体积和耐腐蚀性。通过X射线衍射(XRD),X射线光电子能谱(XPS)和扫描电子显微镜(SEM)也研究了微观结构,化学成分和形态。将得到的结果转化为信噪比(S / N),并进行差异分析(ANOVA)。发现施加到硅靶的功率是在评估的薄膜性质中产生最大差异的因素。根据因素的组合,检测纳米复合结构和FCC和BCC晶体结构。几乎所有的电影都表现出柱状生长;然而,当修改沉积条件时,柱的宽度受到影响。

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