Surface Plasmon Resonance assisted optical analysis of Strontium Barium Niobate thin films

摘要

Preferred c-axis (0 0 1) oriented SrxBa1-xNb2O6 (SBN60) thin films were grown exploiting Pulsed Laser deposition (PLD) technique. For development of an efficient Electro-Optic (EO) modulator based on SBN60 thin film, observation of minutiae change in refractive index is essential. Highly sensitive Surface Plasmon Resonance (SPR) tool is used to examine the optical property of SBN60 film. Significant increase from 1.94 to 2.50 in refractive index values with increasing deposition pressure from 8mTorr to 12mTorr is observed. Refractive index dispersion with the incident radiation wavelength has been also analysed for SBN60 thin films using SPR technique and theoretically fitted with Sellmeier equation.