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'Mechanically prepared copper surface in oxidizing and non-oxidizing conditions'

机译:“在氧化和非氧化条件下机械制备的铜表面”

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摘要

In the present work surface roughness of copper samples after mechanical surface preparation processes (polishing, grinding, sand-blasting) and after exposure in non-oxidizing (high purity argon) and oxidizing (air) conditions at 700 and 750 degrees C have been evaluated by contact profilometer and by fractal analysis. Quantitative description of surfaces that are hidden from the sight of conventional methods is possible by fractal analysis, e.g. in the present work, the roughness of Cu2O/Cu boundary has been evaluated under oxide layer. It has been pointed out, that in both oxidizing and non-oxidizing conditions initial surface roughness of copper is affected by annealing at high temperature: at 700 degrees C surface roughness of polished and ground samples increased but at 750 degrees C decreased in comparison to surface roughness prior to heat treatment. For sand-blasted samples in both oxidizing and non-oxidizing conditions the lowest values of surface roughness parameters were obtained at 750 degrees C. It is then concluded that two phenomena are responsible for such effect chemical reaction between copper and oxygen and surface diffusion of copper due to high temperature of annealing.
机译:在目前的工作状态下,已评估了机械表面制备工艺(抛光,研磨,喷砂)以及在700和750摄氏度的非氧化(高纯氩)和氧化(空气)条件下暴露后的铜样品的工作表面粗糙度。通过接触轮廓仪和分形分析。通过分形分析(例如分形分析)可以定量描述隐藏在常规方法看不见的表面。在目前的工作中,已经在氧化层下评估了Cu2O / Cu边界的粗糙度。已经指出,在氧化和非氧化条件下,铜的初始表面粗糙度都受到高温退火的影响:与表面相比,在700摄氏度时,抛光和磨削样品的表面粗糙度增加,而在750摄氏度时,粗糙度降低热处理前的粗糙度。对于在氧化和非氧化条件下喷砂的样品,均在750℃时获得最低的表面粗糙度参数值。然后得出结论,两种现象是造成这种影响的原因:铜和氧之间的化学反应和铜的表面扩散由于退火温度高。

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