Synchrotron radiation studies of the growth and beam damage of tin-phthalocyanine on GaAs(001)-1x6 substrates

摘要

The tunability of synchrotron radiation is exploited to probe the structural proper-ties of SnPc films deposited on a GaAs(001) surface. Soft X-ray photoelectron spectroscopy (SXPS) shows that the organic adlayer is weakly interacting with the surface and that the growth mode is Stranski-Krastanov. Near edge X-ray absorption fine structure (NEXAFS) shows that the plane of SnPc molecules in a thick adlayer is close to parallel with the substrate. High photon flux 'beam damage' is apparent in an increased binding energy of the Sn4d core level. (C) 2004 Elsevier B.V. All rights reserved.