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Growth of oxide thin films for optical gas sensor applications

机译:用于光学气体传感器应用的氧化物薄膜的生长

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Tungsten trioxide and titanium dioxide thin films were synthesised by pulsed laser deposition. We used for irradiations of oxide targets an UV KrF* (gimel = 248 nm, tau(FWHM) congruent to 20 ns, v = 2 Hz) excimer laser source, at 2 j/cm(2) incident fluence value. The experiments were performed in low oxygen pressure. The (001) SiO2 substrates were heated during the thin film deposition process at temperature values within the 300-500 degrees C range. The structure and crystalline status of the obtained oxide thin films were investigated by high resolution transmission electron microscopy. Our analyses show that the films are composed by nanoparticles with average diameters from a few to a few tens of nm. Moreover, the films deposited at substrate temperatures higher than 300 degrees C are crystalline. The tungsten trioxide films consist of a mixture of triclinic and monoclinic phases, while the titanium dioxide films structure corresponds to the tetragonal anatase phase. The oxide films average transmittance in the visible-infrared spectral range is higher than 80%, which makes them suitable for sensor applications. (c) 2005 Elsevier B.V. All rights reserved.
机译:通过脉冲激光沉积合成三氧化钨和二氧化钛薄膜。我们使用2 k / cm(2)入射能量通量值的UV KrF *(gimel = 248 nm,tau(FWHM)等于20 ns,v = 2 Hz)的准分子激光源辐照氧化物。实验在低氧气压力下进行。在薄膜沉积过程中,将(001)SiO2衬底在300-500摄氏度范围内的温度值下加热。通过高分辨率透射电子显微镜研究了所得氧化物薄膜的结构和结晶状态。我们的分析表明,薄膜由平均直径为几纳米到几十纳米的纳米颗粒组成。此外,在高于300摄氏度的基板温度下沉积的薄膜是结晶的。三氧化钨膜由三斜相和单斜晶相的混合物组成,而二氧化钛膜的结构对应于四方锐钛矿相。氧化膜在可见红外光谱范围内的平均透射率高于80%,这使其适用于传感器应用。 (c)2005 Elsevier B.V.保留所有权利。

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