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Stability and fragmentation of organic silicon functionalizations studied by laser desorption mass spectrometry

机译:激光解吸质谱研究有机硅官能团的稳定性和碎片化

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A method is introduced to investigate organic functionalizations on silicon by laser-induced thermal desorption (LITD), where well-ordered Si(111)-(1 x 1):H(D) surfaces are used todetermine the desorption temperature as a function of laser fluence. To demonstrate the potential of this technique silicon surfaces with ultrathin oxide layers were functionalized with organic end groups. The species desorbed with focused XeCl laser pulses were monitored at an oblique angle and their time-of-flight (TOF) distributions were measured with a quadrupole mass analyzer after electron impact ionization. By assuming a negligible contribution of the oxide and organic layers to the heating effect, the TOF temperatures measured for Si(111)-(1 x 1):H(D) could be used to determine the mass of the desorbed species. Detailed results are presented for dimethylsilyl (DMS), bromomethyldimethylsilyl (BMDMS), and chloromethyldimethylsilyl (CMDMS) terminated surfaces which were prepared by silaniza-tion with suitable chloro and disilazane compounds. While for the DMS termination dimethylsilanol (76 u) is desorbed as a single species, clearly identifying the terminating group, in the case of BMDMS and CMDMS further fragmentation of the end group occurs at the surface.
机译:引入了一种方法来研究激光诱导的热脱附(LITD)在硅上的有机功能化,其中使用有序的Si(111)-(1 x 1):H(D)表面确定脱附温度随温度的变化。激光通量。为了证明该技术的潜力,用有机端基对具有超薄氧化层的硅表面进行了功能化。用倾斜XeCl激光脉冲解吸的物质以倾斜角度进行监测,并在电子碰撞电离后用四极杆质量分析仪测量其飞行时间(TOF)分布。通过假设氧化物和有机层对加热效果的贡献可忽略不计,可以将针对Si(111)-(1 x 1):H(D)测得的TOF温度用于确定解吸物质的质量。给出了针对二甲基甲硅烷基(DMS),溴甲基二甲基甲硅烷基(BMDMS)和氯甲基二甲基甲硅烷基(CMDMS)封端的表面的详细结果,这些表面是通过与合适的氯和二硅氮烷化合物进行硅烷化反应制备的。对于DMS封端,二甲基硅烷醇(76 u)作为单个物质解吸,可以清楚地识别封端基团,而对于BMDMS和CMDMS,端基的进一步断裂发生在表面上。

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