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Effect of substrate temperature on the morphology, structural and optical properties of Zn_(1-x)Co_xO thin films

机译:衬底温度对Zn_(1-x)Co_xO薄膜的形貌,结构和光学性质的影响

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摘要

Zn_(1-x)Co_xO thin films with c-axis preferred orientation were deposited on sapphire (0001) by pulsed laser deposition (PLD) technique at different substrate temperatures in an oxygen-deficient ambient. The effect of substrate temperature on the microstructure. morphology and the optical properties of the Zn_(1-x)Co_xO thin films was studied by means of X-ray diffraction (XRD), atomic force microscopy (AFM), UV-visible-NIR spectrophotometer, fluorescence spectrophotometer. The results showed that the crystallization of the films was promoted as substrate temperature rose. The structure of the samples was not distorted by the Co incorporating into ZnO lattice. The surface roughness of all samples decreased as substrate temperature increased. The Co concentration in the film was higher than in the target Emission peak near band edge emission of ZnO from the PL spectra of the all samples was quenched because the dopant complexes acted as non-radiative centers. While three emission bands located at 409 nm (3.03 eV), 496 nm (2.5 eV) and 513 nm (2.4 eV) were, respectively, observed from the PL spectra of the four samples. The three emission bands were in relation to Zn interstitials, Zn vacancies and the complex of V_0 and Zn_1 (V_0Zn_i). The quantity of the Zn interstitials maintained invariable basically, while the quantity of the V_0Zn slightly decreased as substrate temperature increased.
机译:在氧气不足的环境中,通过脉冲激光沉积(PLD)技术在不同的衬底温度下,将具有c轴优先取向的Zn_(1-x)Co_xO薄膜沉积在蓝宝石(0001)上。基材温度对微观结构的影响。通过X射线衍射(XRD),原子力显微镜(AFM),紫外可见近红外分光光度计,荧光分光光度计研究了Zn_(1-x)Co_xO薄膜的形貌和光学性质。结果表明,随着基底温度的升高,薄膜的结晶化得到促进。样品的结构不会因掺入ZnO晶格中的Co而变形。所有样品的表面粗糙度都随着基材温度的升高而降低。薄膜中的Co浓度高于所有样品的PL光谱中ZnO的接近带边缘发射的目标发射峰,这是因为掺杂物络合物充当了非辐射中心,因此猝灭了。从四个样品的PL光谱分别观察到三个发射带分别位于409 nm(3.03 eV),496 nm(2.5 eV)和513 nm(2.4 eV)。这三个发射带与锌间隙,锌空位以及V_0和Zn_1(V_0Zn_i)的络合物有关。 Zn间隙的数量基本上保持不变,而V_0Zn的数量随着衬底温度的升高而略有下降。

著录项

  • 来源
    《Applied Surface Science》 |2011年第9期|p.3856-3860|共5页
  • 作者单位

    College of Physics and Electronics, Shandong Normal University, No. 88, East Wenhua Road, Jinan 250014, PR China Laiwu Vocational and Technical College, Laiwu, Shandong 271100, PR China;

    College of Physics and Electronics, Shandong Normal University, No. 88, East Wenhua Road, Jinan 250014, PR China;

    College of Physics and Electronics, Shandong Normal University, No. 88, East Wenhua Road, Jinan 250014, PR China;

    College of Physics and Electronics, Shandong Normal University, No. 88, East Wenhua Road, Jinan 250014, PR China;

    College of Physics and Electronics, Shandong Normal University, No. 88, East Wenhua Road, Jinan 250014, PR China;

    College of Physics and Electronics, Shandong Normal University, No. 88, East Wenhua Road, Jinan 250014, PR China;

    College of Physics and Electronics, Shandong Normal University, No. 88, East Wenhua Road, Jinan 250014, PR China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Zn_(1-x)Co_xO thin films,PLD,Substrate temperature,Morphology,Structural and optical properties;

    机译:Zn_(1-x)Co_xO薄膜;PLD;衬底温度;形貌;结构和光学性质;
  • 入库时间 2022-08-18 03:07:02

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