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首页> 外文期刊>Applied Surface Science >X-ray absorption spectroscopy and photoluminescence study of rare earth ions doped strontium sulphide phosphors
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X-ray absorption spectroscopy and photoluminescence study of rare earth ions doped strontium sulphide phosphors

机译:稀土离子掺杂硫化锶荧光粉的X射线吸收光谱和光致发光研究

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摘要

We present here the electronic structure and photoluminescence properties of Sm (0.1-1.0 mol%) doped SrS phosphors. The doping in SrS was probed by near-edge X-ray absorption fine structure (NEXAFS) at M_(5,4)-edges of Sm in total electron yield mode. The simulated absorption edges using atomic multiplet calculations were correlated with experimental results, which clearly reveal the presence of trivalent state of Sm in SrS matrix. However, for Sm (1 mol%), very minor traces of Sm~(2+) were also observed, which have been explained by comparing the NEXAFS spectra in total electron and florescence yield mode. The PL emission of SrS:Sm comprises of three sharp bands at 567, 602 and 650 nm owing to the well-known intra 4/transitions from ~4G_(5/2) to ~6H_J (J=5/2, 7/2, 9/2) levels of Sm~(3+) ions in SrS host The effect of Ce co-doping on SrS:Sm phosphors was also investigated, which exhibits characteristic PL emission of independent ions at their respective excitation wavelengths. However, at an excitation wavelength of 393 nm, SrS:Ce,Sm exhibits the simultaneous characteristic PL emission of both ions spanning into blue-green-red region. The CIE chromaticity coordinates also clearly show the influence of excitation wavelengths on the emission colour of SrS :Ce,Sm.
机译:我们在这里介绍了Sm(0.1-1.0 mol%)掺杂的SrS荧光粉的电子结构和光致发光性能。在SrS的M_(5,4)-边缘以全电子产率模式通过近边缘X射线吸收精细结构(NEXAFS)探测SrS中的掺杂。使用原子多重峰计算模拟的吸收边与实验结果相关,这清楚地揭示了SrS基质中Sm的三价态的存在。然而,对于Sm(1 mol%),也观察到了极少量的Sm〜(2+)痕迹,这可以通过比较全电子和荧光产率模式下的NEXAFS光谱来解释。由于众所周知的从〜4G_(5/2)到〜6H_J的内部4 /跃迁,SrS:Sm的PL发射在567、602和650 nm处包含三个尖峰带(J = 5/2,7/2 ,SrS主体中Sm〜(3+)的9/2)离子水平还研究了Ce共掺杂对SrS:Sm荧光粉的影响,该荧光粉在独立的激发波长下表现出独立离子的特征PL发射。然而,在393 nm的激发波长下,SrS:Ce,Sm表现出跨越蓝绿红区域的两个离子的同时特征PL发射。 CIE色度坐标也清楚地显示了激发波长对SrS:Ce,Sm的发射颜色的影响。

著录项

  • 来源
    《Applied Surface Science》 |2013年第1期|237-241|共5页
  • 作者单位

    Advanced Analysis Centre, Korea Institute of Science and Technology, Seoul 136791, Republic of Korea,Centre for Material Science and Engineering, National Institute of Science and Technology, Hamirpur 177005, India;

    Advanced Analysis Centre, Korea Institute of Science and Technology, Seoul 136791, Republic of Korea;

    School of Physics, Shri Mata Vaishno Devi University, Katra 182320, India;

    Amity School of Engineering and Technology, Amity University Haryana, Curgaon 122413, India;

    Centre for Material Science and Engineering, National Institute of Science and Technology, Hamirpur 177005, India;

    Department of Physics, Kurukshetra University Kurukshetra, Kurukshetra 136119, India;

    Advanced Analysis Centre, Korea Institute of Science and Technology, Seoul 136791, Republic of Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    NEXAFS; SrS:Sm; PL emission and excitation;

    机译:NEXAFS;SrS:Sm;PL发射和激发;

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