首页> 外文期刊>Applied Surface Science >Surface sensitivity of elastic peak electron spectroscopy
【24h】

Surface sensitivity of elastic peak electron spectroscopy

机译:弹性峰电子光谱的表面灵敏度

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

New theoretical model describing the sampling depth of elastic peak electron spectroscopy (EPES) has been proposed. Surface sensitivity of this technique can be generally identified with the maximum depth reached by trajectories of elastically backscattered electrons. A parameter called the penetration depth distribution function (PDDF) has been proposed for this description. Two further parameters are descendant from this definition: the mean penetration depth (MPD) and the information depth (ID). From the proposed theory, relatively simple analytical expressions describing the above parameters can be derived. Although the Monte Carlo simulations can be effectively used to estimate the sampling depth of EPES, this approach may require a considerable amount of computations. In contrast, the analytical model proposed here (AN) is very fast and provides the parameters PDDF, MPD and ID that very well compare with results of MC simulations. As follows from detailed comparisons performed for four elements (Al, Ni, Pd and Au), the AN model practically reproduced complicated emission angle dependences of the MPDs and the IDs, correctly indicating numerous maximum and minimum positions. In the energy range from 200 eV to 5 keV, the averaged percentage differences between MPDs obtained from the MC and the AN models were close to 4%. An important conclusion resulting from the present studies refers to the procedure of determination of the inelastic mean free path (IMFP) from EPES. Frequently, the analyzed sample is deposited as a thin overlayer on a smooth substrate. From an analysis of the presently obtained IDs, is follows that 99% of trajectories in analyzed experimental configurations reaches depth not exceeding 2.39 in units of IMFP. Thus, one can postulate that a safe minimum thickness of an overlayer should be larger than about 3 IMFPs. For example, the minimum thickness of an Al overlayer shoud be about 8 nm at 5000 eV. (C) 2016 Elsevier B.V. All rights reserved.
机译:提出了描述弹性峰电子光谱(EPES)采样深度的新理论模型。这项技术的表面灵敏度通常可以通过弹性反向散射电子的轨迹达到的最大深度来识别。对于该描述,已经提出了称为穿透深度分布函数(PDDF)的参数。该定义还衍生出另外两个参数:平均穿透深度(MPD)和信息深度(ID)。从提出的理论中,可以得出描述上述参数的相对简单的解析表达式。尽管可以将蒙特卡洛模拟有效地用于估计EPES的采样深度,但是这种方法可能需要大量的计算。相比之下,此处提出的分析模型(AN)速度很快,并且提供了与MC仿真结果很好比较的参数PDDF,MPD和ID。从对四个元素(Al,Ni,Pd和Au)进行的详细比较可以看出,AN模型实际上再现了MPD和ID的复杂发射角依赖性,正确地指示了许多最大和最小位置。在200 eV至5 keV的能量范围内,从MC和AN模型获得的MPD之间的平均百分比差异接近4%。本研究得出的重要结论涉及从EPES确定非弹性平均自由程(IMFP)的程序。通常,被分析的样品作为薄的覆盖层沉积在光滑的基材上。通过对当前获得的ID的分析,可以得出以下结论:在分析的实验配置中,有99%的轨迹以IMFP为单位达到不超过2.39的深度。因此,可以假定覆盖层的安全最小厚度应大于大约3个IMFP。例如,Al覆盖层的最小厚度在5000 eV时应约为8 nm。 (C)2016 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号